George Heath1, Emily Micklethwaite1, Tabitha Storer1
1University of Leeds
Here we present open-source software developed for high-throughput automatic processing of Atomic Force Microscopy (AFM) image and movie data. AFM, High-Speed AFM, simulation AFM and Localization AFM (LAFM) enable the study of surfaces with increasingly higher spatiotemporal resolution. However, efficient and rapid analysis of the images and movies produced by these techniques can be challenging, often requiring the use of multiple image processing software applications and scripts. The combined co-localization and development of these tools will enable new analysis opportunities and improved resolution. Our software, NanoLocz, has been developed as an AFM and high-speed AFM analysis platform that facilitates import of raw data, automatic pre-processing and various single-particle analysis workflows designed to quickly leverage the rich data AFM has to offer. Workflows include but are not limited to: single-particle tracking, single-particle topographic feature analysis, single-molecule LAFM, time-resolved LAFM, and simulation LAFM.